A Circuit That Sees Radiation Strikes Could Keep Errors at Bay – IEEE Spectrum

http://spectrum.ieee.org/tech-talk/semiconductors/design/a-circuit-that-sees-radiation-strikes-could-keep-errors-at-bay

For a short time, it looked like the worlds electronics would be safe (well, safer) from radiation. With the switch from planar transistors to FinFETs, ICs suddenly became naturally resistant (literally) to having their bits flipped by a neutron splashing into them and blasting lose a small cloud of charge. 

But two things are now making them vulnerable again: One is the move to operating at voltages so low, that it’s easier for a pulse of radiation-induced charge to flip a transistor on or off. The other is how the unprecedented density of those transistors is giving radiation more targets than ever.
Engineers are working on a solution that could help bring down the rate of so-called logic soft errors—signals temporarily flipped by a radiation strike